The Bruker Nanomechanical Testing business announced the release of the Hysitron PI 89 SEM PicoIndenter™ to provide nanomechanical testing capabilities inside a scanning electron microscope (SEM) at higher loads and in more extreme environments than previously possible. This benefits researchers’ understanding of the deformation mechanisms of high-strength materials. The new system combines Bruker’s high-performance controller with exclusive capacitive transducer and intrinsic displacement technologies to enable unmatched force and displacement ranges. The PI 89 SEM PicoIndenter is the first in-situ instrument with two rotation and tilt stage configurations. This enables flexible sample positioning toward the electron column for top-down imaging, tilting toward the FIB column for milling, spindle rotation for crystallographic alignment, and compatibility with a wide range of detectors to enable structure-property correlation of complex materials.
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